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Hitachi

Hitachi High-Technologies in Canada

High-Sensitivity Element Monitor EA1200VX

The EA1200VX High-Sensitivity Element Monitor supports a wide range of applications from RoHS/ELV compliance screening to advanced analysis. Equipped with a unique XRF detector, the Vortex, which features high resolution, sensitivity and count rate, the EA1200VX has remarkably improved overall sensitivity. Using the instrument in combination with the precision control software greatly shortens measurement time.

Features

Phenomenal High Speed Analysis (High Sensitivity)

Measurement times can be greatly shortened, typically to one tenth the time of conventional methods, by combining the high count rate detector and precision control software.

High Count Rate Detector—No LN2 Needed

The EA1200VX is equipped with the world's best high count rate detector "Vortex" which samples at a rate of 150,000 cps and does not require LN2, resulting in an unprecedented level of sensitivity and resolution.

Time-Saving Uni Filter (Optional)

Up to five RoHS restricted elements can be measured at one time using a single composite filter, achieving even shorter measuring times from the already rapid measuring time of the EA1200VX.

Wide Range of Application

Measurement of Na to U element is possible by performing measurements in a vacuum condition (with the Light Element Option). This feature also supports highly sensitive analysis of Cl.

Micro Spot Analysis

With a 1-mmφ x-ray beam, the EA1200VX can perform qualitative and quantitative analyses of micro spots on a printed circuit board.

Sample Changer

The optional sample changer enables the continuous measurements of up to 12 samples even under varying measurement conditions. (Optional) Large samples of up to 430 mm × 320 mm in size can also be measured.

Specifications

Specifications
Elements Atomic nos. 11 (Na) to 92 (U)
*Atomic nos. when using Vacuum Option
Sample state Solid / Powder / Liquid
X-ray source Small Air-cooled x-ray tube (Rh target)
Voltage: 15 kV, 30 kV, 40 kV, 50 kV
Current: 1 mA
X-ray direction Bottom-up Irradiation
Detectors Vortex® (SDD) *No liquid nitrogen required
Analysis area (beam size) 1 mm, 8 mm
Electric switching
Sample observation Color CCD camera
Chamber 430(W) × 320(D) × 200(H) mm
239(W) × 280(D) × 66(H) mm (When using vacuum)
Filter 5 filters automatic switching
Controller Laptop or Desktop
Qualitative functions Spectrum measurement, Auto-ID, Comparison display
Quantitative functions KLM marker display, Subtraction display, Bulk (FP) CAL, Calibration
Data Process Microsoft Excel, Microsoft Word
Power requirements (Electric box included) AC 100 V to 120 V, 200 to 240 ±10%, 5 A

Options

  • Precision control software
  • Spectrum Matching Software (Material Discrimination)
  • Film Analysis (CAL) Software
  • Sample Changer (turret)
  • 3mm Colimeter
  • Vacuum Pump (Light element analysis)
  • Standard Reference Samples
  • UNI Filter
  • * "Microsoft", "Excel" and "Word" are registered trademarks of Microsoft Corporation in the United States and other countries.
  • * Vortex is a registered trademark of Hitachi High-Technologies Science America, Inc. in the United States and a registered trademark of Hitachi High-Tech Science Corporation in Japan.