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Auto focus for better and faster image acquisition
The FT110 Series XRF Coating Thickness Gauge has a new auto focus function which automatically focuses on the sample within a few seconds. No manual adjustment is required, which results in higher throughput.
Once a sample is placed on the stage, an optical image of the sample is automatically displayed.
Optimum geometry provides higher sensitivity even under a micro beam, enabling higher measurement accuracy with a round 0.1 or 0.2 mm collimator.
Measurement can be done without thickness standard sample(s) by expanding the FP software. Measurement of multilayer films and alloy films can be performed easily.
With the new Wide View System (option), the whole sample image can be observed (size max. 250x200mm) and the desired measurement area can be specified.
|ELEMENTS||Atomic Numbers 22(Ti) to 83(Bi)|
|X-RAY SOURCE||Air-cooled small X-Ray Tube
|COLLIMATOR||Round. 0.1mm, 0.2 and two other types|
|SAMPLE OBSERVATION||CCD camera (with wide view system)|
|SAMPLE IMAGE FOCUS||Laser Pointer|
|FILTER||Primary filter automatic switching|
|SAMPLE STAGE||Stage Size: 500（W) x 400(D) x 150（H）mm
Travelling: X:250mm, Y:200mm
|CONTROLLER||Desktop Computer with 19 inch LCD Monitor|
|APPLICATION SOFTWARE||Thin Film FP (All types of thin films: Max 5 layers,10 elements per layer), Calibration|
|DATA PROCESSING||Microsoft® Excel, Microsoft® Word|
|SAFETY FUNCTIONS||Sample door interlock, Sample crash prevention mechanism, Diagnostic Function|