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Hitachi

Hitachi High-Technologies in Canada

Hitachi AFM5100N Compact Generic-Purpose Atomic Force Microscope

Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can effectively simplify AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very challenging samples.

Overview

The Hitachi AFM5100N Atomic Force Microscope is a compact, general-purpose AFM equipped with a built-in high-resolution sensor lever for manual operation.

Features

1. Simple Cantilever Installation and Operation

In conventional models, levers are very small and difficult to handle, but the internal sensor lever of the AFM5100N is large and easy to install and operate.

2. Laser Optic Axis Adjustment No Longer Necessary

With the optic lever, adjustment is required to align the laser axis to the cantilever. With the self-detection system of the AFM5100N, it is no longer necessary.

3. Accurate Positioning by Using a PinPoint Cantilever

The cantilever is designed to allow verification from directly above the position of the probe tip. Positioning of the measurement area is made easy. Also, high resolution is acheived by sharpening the probe.

4. Space-Saving Design

Isolation mechanism, wind shield cover, top USB camera enabling observation of sample, and cantilever are all combined in a compact instrument.

5. Easy Navigation

With a flow-chart navigation system, observing high-resolution surfaces is now a breeze for any user. Setting measurement parameters can also be done by simply following a wizard-style procedure.

6. Superior Expandability

The AFM5100N accommodates various functions via the alignment of the optic lever method. Also, change to the light lever method is completed by inserting one cable.

 

Specifications

DETECTION METHOD Self detection method (Optic lever method)
SAMPLE SIZE Maximum 35mmφ, Thickness 10mm (exclusive jig usage time 20mm)
SCAN RANGE
(In-plane/vertical)
20um□/ 1.5umH, 100um□/ 15umH, 150um□/ 5umH, 110um□/ 6umH (Closed loop control)
MEASUREMENT MODE DFM (Dynamic Force Mode), PM (Phase mode)
POSITIONING MICROSCOPE Top observation USB camera, Zoom microscope, Optic microscope,Metal microscope
VIBRATION ISOLATION MECHANISM Simple isolation block, Bench top vibration isolation stand,
Frame isolation stand
OPERATION WINDOW Flow chart form navigation system
SURFACE ROUGHNESS MEASUREMENT Surface roughness JIS standard (JIS R 1683:2007)
FUNCTION EXPANDABILITY AFM, STM, SIS、FFM, LM-FFM, VE-AFM/DFM, Adhision, CURRENT, KFM, PRM, SNDM, SSRM, EFM, MFM