Skip to main content


Hitachi High-Technologies in Canada

Hitachi H-9500 300kV TEM

The H-9500 is a 100-300 kV TEM with LaB6 electron gun. This is a user-friendly workhorse for atmoic-resolution TEM imaging and routine structural characterization. The excellent imaging capability also makes the H-9500 a platform for in-situ TEM. Various Hitachi in-situ heating TEM specimen holders enable the imaging of dynamic structural changes at elevated temperatures. A special version for gas environmental in-situ TEM is available.


  • Atomic resolution gas injection-heating in-situ TEM
  • Digital, user-friendly atomic resolution imaging
  • High sample throughput
  • Fast and slow CCD camera systems
  • High stability 5-axis side-entry hyper stage

The H-9500 300 kV transmission electron microscope is designed to support research on solid state materials and polymeric materials. The H-9500 300 kV TEM utilizes modern computer control and digital cameras to enhance user-friendliness. The H-9500 is known for its ease of atomic resolution imaging, high sample throughput and a wide variety of analytical capabilities.


Electron Gun Single crystal LaB6
Accelerating Voltage 300 kV, 200 kV, 100 kV
Resolution 0.10 nm (crystal lattice)
0.18 nm (point-to-point)
Magnification x200 - x1,500,000


Application Notes

Note Number:
Among the most challenging issues in technologies for electrochemical energy conversion are the insufficient activity of the catalysts for the oxygen reduction reaction, catalyst degradation and carbon-support corrosion. In an effort to address these barriers, we aimed towards carbon-free multi/bimetallic materials in the form of mesostructured thin films with tailored physical properties. We present here a new class of metallic materials with tunable near-surface composition, morphology and structure that have led to greatly improved affinity for the electrochemical reduction of oxygen.

Technical Notes

It is well known that analysis using transmission electron microscopes (TEM) yields very high resolution images of thin specimens. However, the applicability of TEM analysis is not universal due to the requirement that a high internal vacuum is required. This high vacuum precludes the TEM study of living specimens or specimens in a gas or liquid environment. In order to tackle this problem, L. Marton of Universite Libre in Brussels, Belgium was the first to design an environmental cell (E-cell) in 1935 that was sealed in the tip of a TEM sample holder.

Doc Number:
Microscopy Today September 2006

Why Environmental TEM (ETEM)? Learn what you can do with Hitachi's ETEMs.

Doc Number: