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Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging surface at any pressure. The SU3500 is sure to be the workhorse in any laboratory.
The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.
The electron optics design yields unmatched imaging performance achieving high resolution at low accelerating voltage.
Accelerating Voltage: 3kV, Secondary Electron (SE)
Image | Magnification: x40,000, Resolution:7nm
Accelerating Voltage: 5kV, Backscattered Electron
(BSE) Image | Magnification: x30,000,
Unique live signals can be mixed and displayed as a combined live image.
Sample: Vinca (Periwinkle)
Vacc: 3.0kV Mag: 190x
Sample: Plum Flower Pollen
Vacc: 1.5kV Mag: 350x
Vacc: 15kV Mag: 100x
Sample: Brass Fracture
Vacc: 15kV Mag: 5000x