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Hitachi

Hitachi High-Technologies in Canada

ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM

The ZONE cleaner is a powerful and easy tool for removing hydrocarbon contamination of electron microscopy samples. ZONE is an easy-to-use cleaner for pre-analysis sample preparation, ensuring the best possible data from your SEM or TEM samples.

Overview

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to reveal the true surface of your specimens. There are two models: ZONESEM and ZONETEM.

ZONESEM

ZONESEM's sample holder stage was designed for Hitachi Type I and Type II carriers. Adjustable height and optional holders available. Provides effective cleaning of surfaces up to 70 mm in diameter.

ZONETEM

ZONETEM provides optimized cleaning of TEM grid specimens via simultaneous cleaning and storage of up to three TEM holders. Designed for Hitachi specimen holders for TEM, STEM, FIB, and in-lens TEM systems. ZONETEM serves as an excellent desiccator to prevent holder out-gassing.

Application Gallery

Sample: Mesoporous Titanium Oxide


Before ZONE Cleaning


After ZONE Cleaning

Sample: Gold on Carbon


Before ZONE Cleaning


After ZONE Cleaning

Sample: Magnetic Tape


Before ZONE Cleaning


After ZONE Cleaning

Library

Literature

Sample surfaces are inevitably coated with hydrocarbon contamination due to sample preparation or from storage. The ZONE desktop sample cleaner/desiccator gently removes contaminations to reveal the true surface of your specimens. There are two models: ZoneSEM and ZoneTEM.

The Hitachi ZONE Desktop Sample Cleaner is the next generation pre-analysis solution, offering an easy-to-use sample cleaning system that ensures the best possible images and data from your SEM or TEM samples.

Technical Notes

Hitachi High-Technologies Canada recently developed the ZONE cleaning systems—ZONE-SEM and ZONE-TEM—as stand-alone, one-stop sample cleaning tools to effectively remove specimen hydrocarbon contamination for both bulk SEM samples and thin TEM samples.

Note Number:
Microscopy Today November 2012