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The AZtecOne system combines the simple-to-use yet powerful software and the proven stability and accuracy of a Silicon Drift Detector.
(Manufactured for Hitachi High-Technologies Corporation by Oxford Instruments NanoAnalysis)
Equipped with 5 navigation buttons, each of which are designed to help you perform tasks quickly and easily
High resolution X-ray map
Quantitative result are shown in graphical or numerical form
TruMap is a unique real-time mapping solution that takes advantage of the increased counts generated by the latest SDD detectors, offering a new level of data integrity.
TruMap reveals real element variations.
Overlaps such as AsL/MgK are resolved.
|Detector type||Silicon Drift Detector (SDD)|
|Detection area||30 mm2||10 mm2|
|Energy resolution||158 eV(Cu-Kα)
(equivalent to 137 eV with MnKα)
(equivalent to 129 eV with MnKα)
|Qualitative analysis||Auto ID and manual ID|
|Quantitative analysis||Standardless quantitative analysis|
|Point & ID(Beam control)||○|
|Standard Map / Line scan||○|
|TruMap / TruLine||○||－|
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.