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Hitachi

Hitachi High-Technologies GLOBAL

XRF Analyzer EA1000AIII

The EA1000A III X-ray Fluorescence Analyzer achieves better throughout by shortening the measurement time by 1/3 compared with our previous model. The precision control software, which was optional for the former models, is now standard, improving the cost effectiveness.

Features

Low Cost Entry Model

Newly employed silicon semiconductor detector, speed-up of electric control system and mechanical drive system have shortened measurement time three times faster than the conventional model (SEA1000AII) while price remains about the same.
The EA1000AIII comes standard with Hazardous Substance Measurement Software Ver.2.

New Version of Hazardous Substance Measurement Software with a Variety of New Functions

Material ID Function

The EA1000A III rapidly identifies materials of different types of samples as soon as the measurement starts. Previously, an analytical recipe had to be selected first, but now there is no need to select an analytical recipe; the instrument can automatically identify a material.

Improved operability - Operation Panel -

The user can monitor the measurement status via the progress bar on the Operation Panel as well as the sound indicators.

Standard reference materials for various environmental regulations (optional)

A variety of standard reference samples developed and manufactured in-house are available; those include not only for the RoHS restricted elements (Cd, Pb, Hg, Br, and Cr), but also for other elements such as chlorine (Cl), antimony (Sb) and tin (Sn) and so forth.

Sample Changer (optional)

Sample changer enables continuous measurement of up to 12 samples.

Data and trend management by the Hazardous Substance Measurement Software Ver.2

Software manages the data (retrieval, browsing, analysis, editing, printing, and report preparation) measured by one or more instrument, allowing higher inspection efficiency and cost reduction.

Specifications

Specifications
Elements Atomic Number: 13 (Al) to 92 (U)
Sample type Solid, Powder, Liquid
X-ray source X-ray tube (Rh target)
Voltage: 15 kV, 40 kV, 50 kV
Current: 1 mA (10 μA to 1,000 μA variable)
X-ray irradiation direction Bottom-Up method
Detector Si semiconductor detector (Liquid nitrogen not required)
Analysis Area 1 mm, 3 mm, 5 mm (automatic switching)
Sample imaging Color CCD camera
Sample chamber 370(W) × 320(D) × 120(H) mm
Filters 5 mode automatic switching (including OFF)
Operation unit Laptop or Desktop personal computer
Software
  • X-ray Station
    • Qualitative Analysis (Spectrum measurement, Automatic ID,
    • KLM Marker Display, Compare/Subtract Displays)
    • Quantitative Analysis (Bulk FP, Bulk Calibration)
    • Routine Measure
  • Environmentally regulated substance measurement software Ver. 2
Data Processing Microsoft Excel, Microsoft Word
Power usage AC 100 V to 240 V ±10%, single phase
Accessory parts Two types of sample cup (for liquid and microscopic sized samples)

Options

  • Sample Changer (turret) that holds up to 12 samples
  • Film Analysis FP software
  • Film Analysis Calibration software
  • Spectrum Matching (Compares with the spectrum of registered standard samples)
  • Environmentally regulated substance measurement software Ver.1
  • Various types of standard sample (Standards samples for environmentally control, Pb free solder standard samples, Pb free solder film standard samples)
  • Signal tower
  • Printer
  • * "Microsoft", "Excel" and "Word" are registered trademarks of Microsoft Corporation in the United States and other countries.

Application Note

Introducing the example of fluorescent X-ray analysis.

Descriptions

Describing the applications and principles of fluorescent X-ray analysis.

Science Ring

The trademark that represents our strong bond with the customer and shows our pledge to connect science and society to create new value.