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Hitachi High-Technologies GLOBAL

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Golden Temple

© Yuya Suzuki, Mitsuru Konno, Tsuyoshi Ohnishi, Toshihide Agemura, Isamu Sekihara, Junzo Azuma (Hitachi High-Technologies corporation)

The micrograph is a Scanning Electron Microscope(SEM) image of a micron sized temple prepared with a Focused Ion Beam(FIB) system.
In the FIB system, a micron-sized Silicon wafer was picked up with the micro-sampling method and mounted on a needle stub of a specimen rotation holder. The posts were also fabricated using FIB by rotating the specimen.

At 64th photo contest hosted by the Japanese Society of Microscopy in 2008.

Condition

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All information related to these photographers is based on the information when the photo was taken.
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This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
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Reproduction or republication without permission prohibited.
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"nanoart" is registered trademark of Hitachi High-Technologies Corporation in Japan.