You are cordially invited to attend our seminar and workshop session, jointly hosted by Hitachi High-Technologies and NSTDA Characterization and Testing Service Center(NCTC).
With the fast paced growth in technology, the techniques and technology used in R&D, failure analysis and quality assurance have to constantly keep up to the global demand and standard. For electron microscopy, the critical factors for ultra-high resolution imaging does not limit just to the performance of the electron microscope, but also as equally critical, the correct specimen preparation techniques, choice of equipment & the skill level of the user. Come learn with us on various specimen preparation techniques including the stress-free Ar broad Ion Milling and fundamental know-hows on ultra-high resolution FE-SEM to achieve good imaging results. Participation is FREE. Due to limited seats available per day, please confirm your attendance with us soon!
Wednesday, 29th June 2016
8:30 am -04:30 pm
Thailand National Science and Technology Development Agency(NSTDA)
111 Thailand Science Park (TSP), Phahonyothin Road, Khlong Nueng, Khlong Luang, Pathum Thani 12120, Thailand
Participation is free but registration is required.
For your questions about these events, you can contact:
Mr. Akira Tsuboyama
Hitachi High-Technologies (Singapore) Pte. Ltd.
Presentation session on principles and imaging techniques on ultra-high resolution FE-SEM (including low kV applications).
Various sample preparation methods of different specimens and application examples, including stress free Ar ion milling techniques.
Interactive live demonstration sessions on latest Ultra High Resolution FE-SEM (Hitachi SU8230), broad Ion milling system (IM4000) and others EM instrument in NCTC lab.
Coffee breaks and lunch will be provided for the events.