General-purpose Small Unit AFM5100N
Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can effectively simplify AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very challenging samples.
Features
Conventional levers are very small and difficult to grip, but the internal sensor type lever is large, easily gripped, and installation is simple.
1. Simple, sure cantilever installation
Conventional levers are very small and difficult to grip, but the internal sensor type lever is large, easily gripped, and installation is simple.
2. Self detection method of laser optic axis adjustment unnecessary
With the optic lever method, adjustment is required to align the laser axis to the cantilever but this is not required if employing the self detection method.
3. Accurate positioning by pin-point type cantilever
The cantilever is structured to allow verification from directly above the position of the probe tip. Positioning of measurement spots is easy. Further, high resolution is acheived by sharpening the probe.
4. Easy operation by Navigation System
Anybody can smoothly observe high resolution surfaces with the flow chart format navigation system. Further, by intuitively answering questions of sample hardness or roughness, measurement parameters can be easily set.
5. Small form factor for flexible, efficient space usage
6. Superior Function Expandability
Various functions can be expanded by adding alignment of the optic lever method . Also, change to the light lever method is completed by inserting one cable.
Specifications
| Specifications | AFM5100N | Optional Accessories |
|---|---|---|
| Manual Stage | XY ±2.5 mm | Impact Stage |
| Sample Size (Selectable) |
35mm (diameter) Thickness: 10 mm |
2inch Adjustment Block 50.08 mm × 50.08 mm × 20 mm |
| Scan Range (Select at least one) |
20 μm × 20 μm × 1.5 μm 100 μm × 100 μm × 15 μm 150 μm × 150 μm × 5 μm |
Closed Loop Scanner 110 μm × 110 μm × 6 μm |
| Detection (Select at least one) |
Self-Detection Optical Lever |
|
| Optical Microscope *Top view (Select at least one) |
Microscope with Cover (Lens magnification: × 4) Desktop Zoom Microscope (Lens magnification: × 7) Zoom Microscope (Lens magnification: × 7) Metallurgical Microscope (Lens magnification: × 5, × 20, × 50) |
|
| Vibration Isolation (Select at least one or supply equivalent table top vibration isolation.) |
Tabletop Floor-model |
|
| Temperature Control | In air: from R.T. to 250°C In liquid: from R.T. to 60°C |
|
| In Liquid | ✔ |
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