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Hitachi

Hitachi High-Technologies in Europe

Centres Científics i Tecnològics de la Universitat de Barcelona
C/ Solé i Sabarís 1-3, 08023 Barcelona
El evento se celebrará en el Aula

Programa

9.00 – 9.30 Breakfast/ Coffee/ Registration
9.30 – 9.45 Introducción de Monocomp Instrumentación
9.45 – 10.30 Basics of SEM and EDX by José Alfonso Seisdedos Bayón, Director de Monocomp Instrumentación
10.30 – 11.00 Imaging surface topography: Understanding Atomic Force Microscopy(AFM) by Dr. Colin Grant, Hitachi SPM Sales & Applications Specialist
11.00 – 11.30 Coffee break
11.30 – 12.00 Hitachi’s wide varieties of SEM sample preparation methods and its applications by Mr. Yu Sugimoto Hitachi EM Sales Manager
12.00 – 12.30 Correlative Microscopy: Combined AFM & SEM for advanced materials characterisations by Dr. Colin Grant
12.30 – 13.15 Hitachi’s latest FE-SEM technology and its applications by Mr. Yu Sugimoto
13.15 – 13.30 Q&A/ Wrap-up

SE RUEGA CONFIRMACIÓN
ENTRADA LIBRE HASTA COMPLETAR AFORO

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