News & Events

2021

Dec 09, 2021

• Two New FE-SEM Models Launched to Support Data-Driven R&D

Aug 30, 2021

• [September 21-22, 2021: Berlin, Germany] Internet of Things World 2021

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2020

Nov 12, 2020

• Hitachi High-Tech Strengthens its Photonics Capabilities to Serve Global Technology Markets

Feb 13, 2020

• [March 05.2020: Stassfurt, Germany] Inspection of electronic components with an electron microscope

Jan 31, 2020

• [March 12.-14, 2020: Berlin, Germany] Deutscher Pflegetag 2020

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2019

Aug 29, 2019

• [Sept 10^th, 2019: Online - webinar] Webinar: SEM imaging and analysis for geological applications

Jul 19, 2019

• [Sep 1^st-5^th, 2019: Technische Universität Berlin, Germany] Enabling science from different perspectives

Jun 12, 2019

• [July 1^st-4^th, 2019: Manchester UK] The Very Best in Microscopy - MMC2019

May 20, 2019

• [July 29^th - August 2^nd, 2019: Munich, Germany] Workshop on Microstructure and Texture Analysis of Biological Hard Tissues and Geological Materials

Apr 16, 2019

• [May 7^th-9^th, 2019: Stuttgart, Germany] Battery Show 2019

Apr 12, 2019

• [May 7^th-10^th, 2019: Stuttgart, Germany] Control International trade fair

Apr 03, 2019

• Hitachi High-Technologies Launches the SU3800 and SU3900 Scanning Electron Microscopes

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2018

Oct 12, 2018

• [December 6-7, 2018: Berlin, Germany] ManuTalk 2018

Oct 12, 2018

• [November 27-29, 2018: Nuremberg, Germany] SPS IPC Drives

Oct 12, 2018

• [November 21-22, 2018: Amsterdam, Netherlands] 2nd International VDI Conference - Digitalization in the Process Industry

Sep 26, 2018

• [November 21-22,2018] 8th NRW Nano Conference, Dortmund, Germany

Sep 26, 2018

• [October 11,2018] Innovations in Electron and Atomic Force Microscopy for Industry and Academia.

Sep 26, 2018

• [September 17–22,2018] Highlights der Physik 2018, Dortmund, Germany

Aug 06, 2018

• [September 18-21,2018] InnoTrans 2018 World's leading transport trade fair in Berlin, Germany.

Jul 31, 2018

• Hitachi High-Technologies Launches the SU7000: A Transformative Schottky Field Emission Scanning Electron Microscope

Jun 06, 2018

• [June 21, 2018] MicroscopíaElectrónicade Barrido(SEM) y FuerzasAtómicas(AFM) workshop in Donostia/San Sebastián

Jun 06, 2018

• [June 19, 2018] MicroscopíaElectrónicade Barrido(SEM) y FuerzasAtómicas(AFM) workshop in Madrid

Jun 06, 2018

• [June 18, 2018] MicroscopíaElectrónicade Barrido(SEM) y FuerzasAtómicas(AFM) workshop in Barcelona

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2017

Dec 19, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] S.I.Report: Examination of the light microscopic slide of renal biopsy specimens by utilizing Low-vacuum scanning electron microscope

Dec 12, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] Technical Explanation: The FlexSEM 1000: A Scanning Electron Microscope Specializing in 3D Morphology Measurements

Dec 05, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] Technical Explanation: Advanced materials research using the Real-Time 3D Analytical FIB-SEM 'NX9000'

Dec 05, 2017

• [Tabletop Microscope Special site] Image Gallery: Materials "Ceramic"

Nov 28, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] Topics: Development of polyoxyethylene stationary phases in capillary liquid chromatography

Nov 28, 2017

• [Tabletop Microscope Special site] Image Gallery: Materials "Ball grid array(BGA)"

Nov 22, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] Technical Explanation: Three-dimensional morphology measurements of ultrasmall regions with the AFM5500M probe microscope

Nov 22, 2017

• [Tabletop Microscope Special site] TM4000 Series: Detection Signals

Nov 14, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] S.I.Report: Temperature Wave Analysis

Nov 14, 2017

• [Tabletop Microscope Special site] Image Gallery: Materials "Rat bronchus"

Nov 07, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] New Products: UV-VIS-NIR Spectrophotometer UH4150 Automatic Measurement System

Oct 31, 2017

• [Tabletop Microscope Special site] Image Gallery: Materials "Copper crystals"

Oct 24, 2017

• [Tabletop Microscope Special site] Image Gallery: Biology "Diatom"

Oct 17, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] New Produccts: Regulus series FE-SEM

Oct 17, 2017

• [SCIENTIFIC INSTRUMENT NEWS Special site] New Produccts: The TM4000 Series A New Type of Tabletop Microscope

Oct 17, 2017

• [Tabletop Microscope Special site] TM4000Plus: Low-Vaccum SE Detector

Oct 17, 2017

• [Tabletop Microscope Special site] Image Gallery: Materials "Magnetic head"

Oct 03, 2017

• [Tabletop Microscope Special site] Image Gallery: Biology "Mast cell"

Aug 04, 2017

• The TM Series 3D visualization software Hitachi map 3D

Aug 01, 2017

• Hitachi High-Technologies develops "ETHOS" High-Performance Composite FIB-SEM System

Jul 25, 2017

• Hitachi High-Technologies Launches New Tabletop Microscope "TM4000" Series

Jul 04, 2017

• Hitachi High-Technologies' Stock Purchase (Subsidiary Acquisition) and Business Acquisition of Part of the Oxford Instruments plc Group and Overview of the New Company

May 29, 2017

• Hitachi High-Technologies Introduces New Regulus Series of Field-Emission Scanning Electron Microscopes

Apr 25, 2017

• Hitachi High-Technologies Launches the Most Advanced Ion-Milling System ArBlade 5000

Mar 07, 2017

• Hitachi High-Technologies Launches New Transmission Electron Microscope

Feb 20, 2017

• E-MRS 2017 Spring Meeting, May 23-25, 2017 in Strasbourg, France, Booth 27 Photonic curing tool, Hybrid (N2 + Low dew point) Dry Air System and Photoelectron spectrophotometer in Air. Please click here for the details of the products

Feb 16, 2017

• Advanced Mineral Identification and Characterization System (AMICS)

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2016

Oct 13, 2016

• ELECTRONICA, November 8-11.2016 in Munich, Germany, Hall A6 Booth 218 3D laser sensor, IGBT, Diodes,MCNEX camera, HDD, Magnetrons, Optical products etc.

Sep 05, 2016

• LV-STEM article;
  High-Resolution, Analytical STEM/SEM Providing Simultaneous Chemical and Bonding Analysis, Atomic Resolution, and Surface Imaging at 30kV and below

Aug 22, 2016

• Hitachi High-Tech at JASIS 2016 September 7-9, 2016 - Makuhari Messe, Japan

Aug 19, 2016

• Heritage of Analytical and Scientific Instruments

Aug 05, 2016

• EMC2016, 29.8. - 2.9.2016 in Lyon, France
  Electron microscope and AFM products

Jul 21, 2016

• Launch of the MirrorCLEM System for Correlative Light and Electron Microscopy

Jul 01, 2016

• Technical magazine "SI NEWS" special edition available!

Apr 15, 2016

• Announcement of the New Scanning Electron Microscope, FlexSEM 1000

Apr 13, 2016

• Hitachi High-Technologies Europe demonstrates NEXTAGE, Humanoid dual arm industrial robot at ANALYTICA (10-13 May in Munich) and AUTOMATICA (21-24 June 2016 in Munich)

Apr 08, 2016

• EMC2016, 29.8. - 2.9.2016 in Lyon, France
  Electron microscope and AFM products

Apr 08, 2016

• ANALYTICA, May 10-13.2016 in Munich, Germany, Hall A2 Booth 440B
  Electron microscope, AFM, XRF and Spectrophotometer products

Apr 08, 2016

• CONTROL, April 26.-29. 2016 in Stuttgart, Germany, Hall 1, Booth 1520
  Electron microscope and XRF products

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2015

Mar 27, 2015

• Notice of web site redesign

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2014

Dec 02, 2014

• Hitachi High-Technologies Europe Donates a Tabletop Scanning Electron Microscope to Turkish Ministry of Education