Throughout human history, materials have played a critical role in the development of civilization, and materials science impacts everything from everyday household items to space applications. Since the invention of electron microscopy and scanning probe microscopy, these techniques have made important contributions to the field of materials science, since they allow the morphology, composition, physical properties, and dynamic behavior of materials to be evaluated. They are indispensable for product quality control and the development of new materials. Hitachi High-Tech offers a diverse product line-up, including tabletop SEM systems that allow quick user-friendly operation, FE-SEM and TEM systems for performing precise detailed analysis, FIB-SEM systems that are capable of three-dimensional analysis.
Scanning Electron Microscope FlexSEM 1000 II
FlexSEM 1000 II employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup.
Scanning Electron Microscopes SU3800/SU3900Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability.
Schottky Field Emission Scanning Electron Microscope SU5000Multi purpose FE-SEM with inovative user interface
Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000The SU7000 is designed to allow simultaneous acquisition of multiple secondary and backscattered electron signals, and enables rapid capture of many types of signals.
Focused Ion and Electron Beam System Ethos NX5000The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. 
Ultra-high Resolution Scanning Electron Microscope SU9000Ultimate high resolution FE-SEM with advanced analysis.
Field Emission Transmission Electron Microscope HF5000Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance
Ion Milling System IM4000PlusIon milling instrument for specimen preparation
Ion Milling System ArBlade 5000The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for elesctron microscopy.
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