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August 22, 2011
On August 19 2011, Hitachi High-Technologies Corporation (TOKYO:8036, Hitachi High-Tech) filed a lawsuit against FEI Japan at the Tokyo District Court, claiming damages for infringement of Japanese Patent No. 2,774,884* related to the Micro-Sampling technology using Focused Ion Beam, taking the effective period of the same patent into consideration.
Hitachi High-Technologies considers its intellectual property rights as extremely important management resources, and will make every effort to protect such rights.
Corporate Communications Dept., CSR Div.
Aiko Matsumoto / Reiko Takeuchi