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February 1, 2018
－Streamlines Analysis by Simplifying the Setting of Optimal Measurement Conditions－
Tokyo, Japan, February 1, 2018—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced that Hitachi High-Tech Science Corporation (Hitachi High-Tech Science), a Hitachi High-Tech wholly owned subsidiary engaged in manufacturing and sales of analysis and measuring instruments, has developed the "EMA" thermal analysis software (EMA). EMA eases operation and enhances efficiency through a guidance function that simplifies the setting of measurement conditions. Hitachi High-Tech Science will launch EMA in the Japanese and overseas markets.
Thermal analyzers are designed to measure the basic thermal properties of materials (thermophysical properties). Thermal analysis enables the measurement of changes in various parameters as materials are heated or cooled, including heat absorption, heat release, weight, volume, and elastic modulus. Thermal analysis is widely used in quality control and inspection applications, as well as in research and development of various materials.
As thermal analyzers are increasingly used for repeated measurement applications, testing methods have been established for many types of materials, resulting in various standards such as Japanese Industrial Standards (JIS), International Organization for Standardization (ISO), and American Society for Testing and Materials (ASTM). The intent of these standards is to remove variations in measurement methods and ensure data consistency. However, the measurement conditions, such as heating time and heating rate, outlined in different testing methods can vary significantly even for a single analysis parameter. For this reason, extensive knowledge and experience have been required to select the ideal measurement conditions. As the number of thermal analyzers in use has increased in recent years, the number of users who do not possess specialized knowledge has also increased. This has created a need for software that enables users of many skill levels to conduct measurements without making errors.
The EMA software launched by Hitachi High-Tech Science is dedicated thermal analysis measurement and post-processing software which users can operate easily and efficiently. EMA can be used in conjunction with the TA7000 series of instruments from Hitachi High-Tech Science, and is backward compatible with data sets collected on older software packages.
While maintaining the user-friendly operability of the existing software, EMA features a new guidance function that easily sets the optimal measurement conditions for the testing methods established by each standards organization. EMA also has a new feature called "Simple Measurement Mode." This feature enables many different measurements to be made, regardless of user proficiency, by storing the detailed conditions of a customer' s routine measurements and having users enter only a bare minimum parameter set for prior to making measurements.
The Hitachi High-Tech Group will continue to promote development and sales expansion, as well as contribute to global manufacturing through testing and analysis equipment. In addition, the Group will consistently aim to "be Global Top in high-tech solutions," and respond swiftly to the needs of customers and markets, working from the customer' s perspective as a fast-moving creator of cutting-edge businesses.
The guidance function navigates users through the process from measurement to analysis and processing based on testing methods stipulated by various standards such as JIS, ISO, and ASTM, thereby enhancing the efficiency and reliability of measurement evaluations. In addition, users can prepare unique measurement recipes based on various standards.
EMA provides a streamlined operating environment in which a majority of the detailed method parameters needed for measurements are stored in advance. Measurements can be made after setting just a few conditions prior to analysis. The software supports touch-panel operation.
EMA features a new editing function for images acquired using the sample observation option during thermal analysis. The function enables editing of image contrast, sharpness, and other parameters. Editing may increase the clarity of images that show physical changes in the samples, allowing the acquired data to be used for the evaluation of minute thermal transitions and related phenomena.
Simple Measurement Mode