Hitachi

Icon List

Icon List

  • ICP Analysis
  • XRF Analyzer
  • XRF Coating Thickness Gauge
  • Atomic Force Microscope (AFM)

ICP Analysis Icon List

··· Sequential Type
··· Compact design
··· Direct Drive
··· High Resolution
··· Vacuum Ultraviolet

  • page top

XRF Analyzer Icon List

··· LN 2 Less
··· Top-down X-ray Irradiation
··· Bottom-up X-ray Irradiation
··· DPD (Digital Peak Deconvolution) Software Installed
··· "HSEASY", Precision Control Software
··· Continuous Multi-point Measurements
··· 2D Mapping Image of Elements
··· Suitable for RoHS Measurement
··· Suitable for General Analysis
··· Suitable for Contaminant Mapping Analysis
··· Continuous Measurement
··· X-ray Transmission System
··· Automatic Detection
··· High-resolution Microscope

  • page top

XRF Coating Thickness Gauge Icon List

··· Top-down X-ray Irradiation
··· Optical zoom with focal distance switching function
··· 75W High Power X-ray Tube
··· Sample Collision Prevention Mechanism
··· High Precision Stage
··· Laser Focus
··· Thin Film FP Software
··· Auto-focus
··· Wide Area Observation System
··· Standardless Analysis
··· X-ray Capilary System
··· High-Intensity Lighting
··· Micro Region

  • page top

Atomic Force Microscope (AFM) Icon List

··· SIS (Sampling Inteligence Scan) Mode
··· Closed Loop Scan
··· Low Coherent Optic Lever Method
··· Temperature Control
··· Measurement in Vacuum
··· Measurement in Liquid
··· RealTuneⅡ Measurement Parameters Auto Tuning Function
··· Automatic Cantilever Exchange
··· Compact & Space Saving
··· Self Detection Method Sensor Built-in Lever

  • page top
© Hitachi High-Tech Corporation. 2001. All rights reserved.