SU3900SE/SU3800SE microscopes are FE-SEMs that possess high-resolution observation capabilities and—unlike general-purpose SEMs—are not limited in terms of the size and weight of samples they can handle. These microscopes also enable users to obtain data with simple operations. These microscopes can be used to observe large, heavy samples, including steel and other industrial materials as well as automotive and aerospace-related parts.
The SE series lineup includes four models (two types with two grades) to respond to measurement needs in a wide variety of fields. This means customers can select products suitable for diverse applications, including microstructure control aimed at increasing the functionality and performance of electronic components, semiconductors, and various other materials as well as contaminant and defect analysis aimed at improving product quality.