General-purpose Small Unit AFM5100N
Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very challenging samples.
Conventional levers are very small and difficult to grip, but the internal sensor type lever is large, easily gripped, and installation is simple.
1. Accurate positioning by pin-point type cantilever
The cantilever is structured to allow verification from directly above the position of the probe tip. Positioning of measurement spots is easy. Further, high resolution is acheived by sharpening the probe.
2. Easy operation by Navigation System
Anybody can smoothly observe high resolution surfaces with the flow chart format navigation system. Further, by intuitively answering questions of sample hardness or roughness, measurement parameters can be easily set.
3. Small form factor for flexible, efficient space usage
4. Superior Function Expandability
Various functions can be expanded by adding alignment of the optic lever method . Also, change to the light lever method is completed by inserting one cable.
|Manual Stage||XY ±2.5 mm||Impact Stage|
Thickness: 10 mm
|2inch Adjustment Block
50.08 mm × 50.08 mm × 20 mm
(Select at least one)
|20 μm × 20 μm × 1.5 μm
100 μm × 100 μm × 15 μm
150 μm × 150 μm × 5 μm
|Closed Loop Scanner
110 μm × 110 μm × 6 μm
*Top view (Select at least one)
|Microscope with Cover
(Lens magnification: × 4)
Desktop Zoom Microscope
(Lens magnification: × 7)
(Lens magnification: × 7)
(Lens magnification: × 5, × 20, × 50)
(Select at least one or supply equivalent table top vibration isolation.)
|Temperature Control||In air: from R.T. to 250°C
In liquid: from R.T. to 60°C
Article information on Hitachi technical magazine "SI NEWS"
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments. Those authors are notable researchers and Hitachi application engineers. This is an General-purpose Small Unit AFM5100N
Describing basic principles and multiple function principles of Scanning Tunnel Microscope (STM), Atomic Force Microscope (AFM) etc.
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.
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