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Sectoral Solutions of Hitachi High-Tech


Seminar Movie

On-Site Analysis and PMI

Product Case Studies


Role of FIB and SEM in Nano-/Micro-scale Mechanical Experiments

Takashi Sumigawa
Ph.D. (engineering) Associate Professor Department of Mechanical Engineering and Science Graduate School of Engineering Kyoto University

Observation of Solution Samples by Transmission Electron Microscope

Yuki Kimura
PhD (science) Associate Professor Institute of Low-Temperature Science Hokkaido University

Visualizing Nanoscale Distribution of Local Corrosion Cells by Open-Loop Electric Potential Microscopy

Takeshi Fukuma
Professor, Doctor of Engineering Division of Electrical Engineering and Computer Science Kanazawa University

Fabrication of nickel barcode nanowire and characterization by SU9000 scanning electron microscope

Tsuyohiko Fujigaya
Ph.D. in Engineering Associate Professor Faculty of Engineering Kyushu University

Features and Applications of the New TM4000 Series of Tabletop Microscopes

京都大学化学研究所 教授
Yusuke Ominami
Takeshi Kamimura
Kota Takagi

ZONE II for SEM: Tabletop Specimen Cleaner

Masako Nishimura
Rie Nakajima
Shinichi Hasegawa
Takeshi Sunaoshi

Introduction of the IM4000 optional device

Atsushi Kamino, Yasushi Kuroda and Hiroyuki Ito

High-sensitivity EDX analysis using QUANTAX FlatQUAD (EDX) with SU8200 Series Instruments

Toshiya Watanabe
(Hitachi High-Tech, Applications Development Dept., Tokyo Solutions Group)

Application Panel

Application Introduction

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