Skip to main content


Hitachi High-Technologies GLOBAL


Golden Temple

© Yuya Suzuki, Mitsuru Konno, Tsuyoshi Ohnishi, Toshihide Agemura, Isamu Sekihara, Junzo Azuma (Hitachi High-Technologies corporation)

The micrograph is a Scanning Electron Microscope(SEM) image of a micron sized temple prepared with a Focused Ion Beam(FIB) system.
In the FIB system, a micron-sized Silicon wafer was picked up with the micro-sampling method and mounted on a needle stub of a specimen rotation holder. The posts were also fabricated using FIB by rotating the specimen.

At 64th photo contest hosted by the Japanese Society of Microscopy in 2008.


All information related to these photographers is based on the information when the photo was taken.
This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
Reproduction or republication without permission prohibited.
"nanoart" is registered trademark of Hitachi High-Technologies Corporation in Japan.