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Friction image that does not rely on surface unevenness or scan direction by adding micro oscillations in the horizontal direction (direction of cantilever deflection) to the sample is observed and the torsion oscillation of the cantilever is detected.


Animation of FFM Observation: Silicon oil film on polystyrene

Friction distribution measurement of silicon oil film on polystyrene
Friction of oil film is less, resulting in dark contrast in FFM and LM-FFM images.
Scan area: 2.5 µm

LM‐FFM receives less topographic influence than FFM.

  • Electron Microscopes (SEM/TEM/STEM)
  • Atomic Force Microscopes (AFM)
    • Description
      • Dynamic Force Microscope (DFM)
      • Scanning Tunneling Microscope (STM)
      • Sampling Intelligent Scan (SIS)
      • Phase Mode (PM)
      • Friction Force Microscope (FFM)
      • Lateral Modulation FFM (LM‐FFM)
      • ViscoElastic AFM (VE‐AFM) / Force Modulation Microscope
      • Adhesion
      • Current / Pico‐current
      • Scanning Spread Resistance Microscope(SSRM)
      • Kelvin probe Force Microscope (KFM)
      • Electrostatic Force Microscope (EFM)
      • Piezo‐Response Microscope (PRM)
      • Magnetic Force Microscope (MFM)
      • Scanning Non‐linear Dielectric Microscope(SNDM)
      • Atomic Force Microscope (AFM) / Contac Mode
    • Special Contents
    • Image Gallery

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