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Hitachi High-Technologies GLOBAL

The DFM measurement detects phase lag in oscillation of the cantilever depending on the size of adsorptive power or hardness and softness, and observes differences in physical properties of the sample surface.


Animation of Phase Mode: Microphase separation


Styrene‐butadiene‐styrene block copolymer

Blended polymer; Polystyrene / Polybutadiene

Amphiphilic di‐block copolymers; PEOm‐b‐PMA(Az) n

chocolate

Grease with thickener

  • Electron Microscopes (SEM/TEM/STEM)
  • Atomic Force Microscopes (AFM)
    • Description
      • Dynamic Force Microscope (DFM)
      • Scanning Tunneling Microscope (STM)
      • Sampling Intelligent Scan (SIS)
      • Phase Mode (PM)
      • Friction Force Microscope (FFM)
      • Lateral Modulation FFM (LM‐FFM)
      • ViscoElastic AFM (VE‐AFM) / Force Modulation Microscope
      • Adhesion
      • Current / Pico‐current
      • Scanning Spread Resistance Microscope(SSRM)
      • Kelvin probe Force Microscope (KFM)
      • Electrostatic Force Microscope (EFM)
      • Piezo‐Response Microscope (PRM)
      • Magnetic Force Microscope (MFM)
      • Scanning Non‐linear Dielectric Microscope(SNDM)
      • Atomic Force Microscope (AFM) / Contac Mode
    • Special Contents
    • Image Gallery

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