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Analytical Systems, Electron Microscopes & Medical Systems

Application data sheet

Sheet number Title
028
High-Resolution and True 3D Measurements of High-Aspect-Ratio SHEET No. 028 Surface Structures on a Butterfly Wing Using the AFM

High-Resolution and True 3D Measurements of High-Aspect-Ratio SHEET No. 028 Surface Structures on a Butterfly Wing Using the AFM

027
Corrosion-induced Deterioration of Ni/Au Plating on Cu: a Correlative SHEET No. 027 AFM-SEM Investigation via Hitachi’s SÆMic. Technology

Corrosion-induced Deterioration of Ni/Au Plating on Cu: a Correlative SHEET No. 027 AFM-SEM Investigation via Hitachi’s SÆMic. Technology

026
Nano 3D Measurements of Ultra-smooth and High-performance Polyester Films Using AFM and CSI

Nano 3D Measurements of Ultra-smooth and High-performance Polyester Films Using AFM and CSI

020
Quantified Elastic Modulus Mapping of Rubber Blend Under Temperature Control Using Hitachi Proprietary SIS-QuantiMech

Quantified Elastic Modulus Mapping of Rubber Blend Under Temperature Control Using Hitachi Proprietary SIS-QuantiMech

019
Mechanical-Property Mapping of Automotive Plastic Materials Using SIS-ACCESS

Mechanical-Property Mapping of Automotive Plastic Materials Using SIS-ACCESS

017
High-Resolution and Accurate AFM Imaging of Nanostructured Copolymer Prepared by Directed Self-Assembly Using a Super-sharp Probe

High-Resolution and Accurate AFM Imaging of Nanostructured Copolymer Prepared by Directed Self-Assembly Using a Super-sharp Probe

016
Dispersion and Dimension Measurements of Cellulose Nanofibers with AFM

Dispersion and Dimension Measurements of Cellulose Nanofibers with AFM

015
Observation of Electrical Properties of P-N Junction in Silicon Solar Cell by SEM-AFM Linkage System

Observation of Electrical Properties of P-N Junction in Silicon Solar Cell by SEM-AFM Linkage System

012
High-Vacuum Conductive-AFM Observation of an Organic Semiconductor Thin Film Solar Cell (P3HT-PEDOT)

High-Vacuum Conductive-AFM Observation of an Organic Semiconductor Thin Film Solar Cell (P3HT-PEDOT)

011
Resolving Individual Magnetic Domains in Single-Crystal ε-Fe2O3via High-Sensitivity in vacuo Magnetic Force Microscopy

Resolving Individual Magnetic Domains in Single-Crystal ε-Fe2O3via High-Sensitivity in vacuo Magnetic Force Microscopy

010
Same Area Observation of Graphene on SiO2 with the SEM-AFM Linkage

Same Area Observation of Graphene on SiO2 with the SEM-AFM Linkage

009
Dopant Distribution Observation with SEM and SNDM

Dopant Distribution Observation with SEM and SNDM

008
SNDM Observation of the Dopant Distribution in a SiC Power Device Cross-section

SNDM Observation of the Dopant Distribution in a SiC Power Device Cross-section

007
Work Function Evaluation in Air and in a Vacuum with One AFM Instrument

Work Function Evaluation in Air and in a Vacuum with One AFM Instrument

006
Simple Acquisition of 3D Information with Flatmilling® 〜Analysis of 3D nano‐structure, composition, magnetism of a hot‐deformed Nd‐Fe‐B permanent magnet

Simple Acquisition of 3D Information with Flatmilling®
〜Analysis of 3D nano‐structure, composition, magnetism of a hot‐deformed Nd‐Fe‐B permanent magnet

005
Effects of the Flatmilling® on the AFM Observation of a Nd-Fe-B Magnet

Effects of the Flatmilling® on the AFM Observation of a Nd-Fe-B Magnet

004
Same Area Observation of the Nano-Structure, Composition and Properties of Crystals and Grain Boundaries

Same Area Observation of the Nano-Structure, Composition and Properties of Crystals and Grain Boundaries

003
Effects of the Cross-section Ion-milling on the SSRM Observation of a Lithium Ion Battery Electrode

Effects of the Cross-section Ion-milling on the SSRM Observation of a Lithium Ion Battery Electrode

002
Ion Milling Processing & Same Area Observation of a Lithium Ion Battery Electrode with SEM and AFM by Using the Air Protection Sample Holder

Ion Milling Processing & Same Area Observation of a Lithium Ion Battery Electrode with SEM and AFM by Using the Air Protection Sample Holder

Applications

This section introduces applications (actual measurement cases) for scanning probe microscopes (SPM/AFM).

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