TM Series Energy Dispersive X-ray Spectrometer: Quantax75

The TM4000 Series offers multiple EDS systems to choose from based on application and budget. All detectors offered are of compact design and do not require LN₂.

*: : Example configuration of Quantax75 EDS in combination with a TM4000 Series SEM
*: : Detector: Built-in type
(Made by Bruker Nano GmbH (Germany))

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Features
Specifications

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Features

Quantax75

Intuitive operation with local spectra observation at specified locations
High-speed colorized X-ray mapping with easy operation
Hypermap function for spot analysis, line analysis, and mapping results in a single acquisition

Dual mode display

Multilateral data visualization is made possible by displaying simultaneous result of spot analysis or line analysis while performing elemental mapping in real time.

Spot analysis

Spectrum displayed in real time, allowing easy visualization of elemental composition for a targeted ROI.
Example at right demonstrates elemental composition at various locations tracked across a linear range.

Live deconvolution

Spectra with overlapping peaks can be separated and visually mapped in real time.

Specifications

Detector

Item	Description
Detector type	Silicon drift detector (SDD)
Detection area	30 mm²
Energy resolution	148 eV(Cu-Kα) (Mn-Kα: equivalent 129 eV or less)
Detection element	B₅~Cf₉₈

Technical magazine
"SI NEWS"

This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.

nanoart

Photo collections of beauty of metals, minerals, organisms etc. reproduced by the electron microscope and finished more beautifully by computer graphic technology.