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Life Sciences

Life Sciences

In many life-science fields, electron microscopy has contributed in a large number of ways, including the discovery of viruses, prevention of infection, clarification of the structure of organelles, drug development, and food safety. It is utilized in a wide variety of fields, such as molecular and cellular biology, microbiology, botany, clinical pathology, pharmacology, and toxicology. It is also used to investigate cell structures and their functions, the ultrastructure of biomolecules and proteins, and three-dimensional structures. Hitachi High-Technologies provides highly advanced tools for life-science applications, such as TEM systems that can be used with ultra-thin sections to investigate the internal structure of cells, and SEM and FIB-SEM systems for three-dimensional structural observations.

Products

Ultra-high Resolution
Scanning Electron Microscope SU9000

SU9000 is the top-of-the-line SEM equipped with cold FE electron source and in-lens objective lens with least aberration, and achieves the world's highest SE resolution of 0.4nm. In addition to high resolution STEM with 0.34nm resolution, EELS and diffraction that are usually considered difficult for SEM can also be supported.

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Schottky Field Emission Scanning Electron Microscope SU5000

SU5000 combines Schottky emission electron source and out-lens objective lens for high resolution imaging and diverse analyses of samples with various sizes and compositions. Its drawer type stage allows applications with special stages such as heating, tensile, and so on. Unique user interface, EM Wizard supports best SEM experience of every user.

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Scanning Electron Microscope SU3500

SU3500 employs thermionic electron source and accommodates a sample with maximum diameter of 200mm or maximum height of 80mm. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Improved resolution at low accelerating voltage and optional Ultra Variable pressure Detector (UVD) enhance surface imaging capability of samples.

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Scanning Electron Microscope FlexSEM 1000

FlexSEM 1000 employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional Ultra Variable pressure Detector (UVD) enhance surface imaging capability of samples under low vacuum environment.

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Tabletop Microscopes TM4000/TM4000Plus

TM4000 series are tabletop microscopes which allow easy SEM observation under low vacuum condition. By integrating EDX, compositional analysis and elemental mapping can be performed. TM4000Plus enables secondary electron imaging under low vacuum condition.

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Tabletop Microscope TM3030Plus
Tabletop Microscope TM3030

TM3030Plus is a tabletop microscope which allows easy SEM observation under low vacuum condition. By integrating EDX, compositional analysis and elemental mapping can be performed. TM3030Plus enables secondary electron imaging under low vacuum condition.

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Transmission Electron Microscope
HT7800 Series

HT7800 series are 120kV digital TEM with enhanced operability. High-resolution screen camera and Image Navigation function ensure comfortable digital operation in a lighted environment. HT7800 offers wide-area, high-contrast imaging while HT7830 realizes best-in-class resolution.

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Transmission Electron Microscope HT7700

HT7700 is a 120kV digital TEM ready for lighted environment. Hitachi's unique dual mode objective lens allows both high contrast imaging and high resolution imaging on a single platform.

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Real-time 3D analytical FIB-SEM
NX9000

SEM column and FIB column are orthogonally arranged to optimize column layout for 3D structural analysis. FE electron source and its unique detection geometry enable high resolution SEM imaging at beam coincident point. 3D-EDS and 3D-EBSD can be performed without moving the stage. Employing micro-sampling and triple beam system, high quality samples can be prepared for TEM and atom probe.

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Focused Ion & Electron Beam System nanoDUE'T NB5000

NB5000 combines high resolution FE-SEM and ultrafast FIB in a single platform. Unique 40kV FIB works well for hard material processing and large area milling. Hitachi's proprietary Micro-sampling allows site-specific TEM sample preparation in a productive manner. Side entry stage enables the use of holders compatible with Hitachi TEM/STEM.

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General-purpose Small Unit
AFM5100N

Hitachi's general-purpose atomic force microscope, Model AFM5100N, features superior ease of use, a wide range of capabilities, and extraordinary performance. The breakthrough hardware option, the self-sensing detector, doesn't require laser and detector alignments and thus can effectively simplify AFM operation. As a full-featured system in support of high-resolution and multifunctional AFM measurements, the AFM5100N offers a wide variety of advanced modes, including the proprietary sampling intelligent scan (SIS), which delivers previously unattainable results for very challenging samples.

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Environment Control Unit
AFM5300E

The Hitachi research-grade AFM5300E offers significantly improved sensitivity, accuracy, and resolution of electromagnetic property measurements operated under high-vacuum conditions. Furthermore, it establishes a benchmark for comprehensive environmental control and is the only tool on the market affording AFM imaging in air/liquid/vacuum, a broad temperature range (-120 °C to 800 °C), magnetic field or humidity controls, as well as correlated AFM/SEM/ion milling investigations.

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