Skip to main content

Hitachi High-Tech
  1. Home
  2. Products & Services
  3. Electron Microscopes / Atomic Force Microscopes
  4. Sample Preparation

Sample Preparation

Sample Preparation Tools for Electron Microscopes

-

Ion Sputter MC1000

An ion sputter increases the conductivity of non-conductive sample to prevent charging during electron microscope observation. MC1000 employs magnetron sputtering technology to reduce damage to the sample, and the target can be selected from among Pt, Pt-Pd, Au and Au-Pd depending on the purpose.

-

Sample Cleaner ZONESEMII

The ZONESEMII Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.

-

Ion Milling System IM4000II

IM4000II supports both cross section milling and flat-milling to prepare specimens depending on the purpose. Cooling Temperature Control, Air Protection Holder Unit, and Various options enable preparation of various cross section specimens.

-

Ion Milling System ArBlade 5000

ArBlade 5000 supports both cross-section milling and flat milling to prepare samples depending on the purpose. Cross section width can be expanded to 8mm for applications requiring wide area milling such as electric components.

-

Sample Cleaner ZONETEM II

The innovative ZONETEM II Desktop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging. ZONE offers easy-to-use cleaning for pre-analysis sample preparation, ensuring the best possible data from your TEM samples.

Related topics

S.I.navi

“S.I.navi” is Hitachi Membership Site for analytical instruments users.
“S.I.navi” provides helpful information for daily analysis.

Hitachi High-Tech Social Media