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Analytical Systems, Electron Microscopes & Medical Systems


Gushing Glass
(DF-STEM image of a solidified Si single crystal after melting at high temperature)


© Toshie Yaguchi, Tadamasa Tsuruta, Takeo Kamino (Hitachi Instrument Engineering Co.,Ltd.)
© Takuji Miyamoto (Instrument Division, Hitachi, Ltd.)

We blew nitrogen gas (N2) against a silicon single-crystal melted in the specimen standby exhauster of the general analysis TEM, solidifying it in an instance. This photo shows the resulting crystal against a dark background. The crystal is still single-crystal in spite of the deformation.

At 51st photo contest hosted by the Japanese Society of Electron Microscopy in 1995.


  • Specimen : Si single crystal
  • Instrument : Transmission Electron Microscope H-9000NAR
  • Magnification : × 15,000
  • Accelerating voltage : 300 kV
  • Processing Condition
  • Heater temperature : 1,450°C
  • Gas pressure : 1.5 ~ 105 Pa
All information related to these photographers is based on the information when the photo was taken.
This work was presented at the "photo contest" hosted by the Japanese Society of Microscopy.
Reproduction or republication without permission prohibited.
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