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© Kouichi Kurosawa, Shuichi Takeuchi, Atsushi Muto, Ryuichiro Tamochi (Hitachi Science Systems, Ltd.)
This cave is an opening for laser beam of SNOM (Scanning Near-field Optical Microscope) processed in FIB (Focused Ion Beam system) in central part of cantilever in fact, it used for the AFM (Atomic Force Microscope). This SNOM is notified in advanced technologies such as nanotechnology as useful analysis tool.
At 59th photo contest hosted by the Japanese Society of Microscopy in 2003.