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Sapporo nano Tower

The micrograph shows a secondary electron(SE) image of the world's smallest tower prepared by a FIB (Focused Ion Beam) technique.
The specimen is extracted from a Si wafer by using a micro-sampling method and mounted on a needle stab of a specimen rotation holder. A towered shape is made by rotating the specimen. Although the FIB was initially developed for fixing and evaluation of semiconductor devices, such micromanipulation technologies have been made a further progress.

First Place (Field 1: Non-biology)
At the 16th International Microscopy Congress (IMC16), Micrograph Competition(2006).

Condition

Instrument (Fabrication): Focused Ion Beam System FB-2100
Accelerating voltage: 40 kV

Instrument (Observation): Ultra-high Resolution Scanning Electron Microscope S-5500
Accelerating voltage: 2 kV

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All information related to these photographers is based on the information when the photo was taken.

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This work was presented at the 16th International Microscopy Congress (IMC16), Micrograph Competition.

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Reproduction or republication without permission prohibited.

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