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© Yasushi Kuroda, Toshie Yaguchi, Tsuyoshi Ohnishi (Hitachi High-Tech corporation)
© Yuka Nishimoto (Hitachi High-Tech Fielding corporation)
The micrograph shows a secondary electron(SE) image of the world's smallest tower prepared by a FIB (Focused Ion Beam) technique.
The specimen is extracted from a Si wafer by using a micro-sampling method and mounted on a needle stab of a specimen rotation holder. A towered shape is made by rotating the specimen. Although the FIB was initially developed for fixing and evaluation of semiconductor devices, such micromanipulation technologies have been made a further progress.
First Place (Field 1: Non-biology)
At the 16th International Microscopy Congress (IMC16), Micrograph Competition(2006).