This website uses JavaScript. If you do not have JavaScript enabled in your browser, this website may not function or appear properly. Please enable JavaScript in your browser settings when using this website.

Region / Language

Contact Information

Hitachi High-Tech

Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)

Principle of SPM, AFM

Special Contents

Physical property evaluation conducted using Environmental Control Unit AFM

SIS(Sampling Intelligent Scan)

Unique Feature

View according to field: Industrial Measurement (Quality Control)

View according to field: Materials Analysis AFM (Semiconductors)

View according to field: AFM for new materials development (Polymers)

View according to field: Materials Analysis AFM (inorganic, metal)

Technical information

By application

Product Case Studies

Image Gallery

AFM Application data sheet

Products & Services

Atomic Force Microscopes (AFM)

Scanning Probe Microscopes/Atomic Force Microscopes (SPM/AFM)

Products & Services

Hitachi High-Tech Social Media

Products & Services

Knowledge

Support

News & Events

About Us

Careers