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Offers advanced analysis functionality and flexible configuration of settings and conditions.
Can be combined with a motorized stage to automate analysis.
Automatically acquire data for multiple specified regions to produce a single combined set of mapping information.
This analysis tool enables automated statistical processing, including classifying particles and determining particle size distributions from qualitative or quantitative analysis of particles detected in each view segment.
|Detector type||Silicon drift detector|
|Detection area||30 mm2|
|Energy resolution||158 eV(Cu-Kα) (equivalent to 137 eV with MnKα)|
|Detection element||B5 - U92|
|Thermal recycle||Can be cooled, but only if required|
|Cooling method||2-level Peltier (No cooling fan; liquid nitrogen not required)
Cooling not necessary if not used
|EDX Detector||145 (width) × 150 (depth) × 200 (height) mm, 2.7 kg|
|X-stream 2 (EDX pulse processor)||180 (width) × 260 (depth) × 330 (height) mm, 2.9 kg|
|MicsF+ (external scan unit)||180 (width) × 260 (depth) × 330 (height) mm, 2.9 kg|
|PC unit (PC, monitor, keyboard)||Standard|