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Simle, intuitive operation
Sample configuration in combination with a TM3030 series instrument
*Screen shows simulated image.
The displayed spectrum tracks the motion of the spot in real time, allowing easy visualization of elements of interest.
A high-throughput(30 mm2) detector allows rapid acquisition of mapping images. Combine with spot analysis to acquire rich, multifaceted information on your sample.
View spectral distributions in real time while varying the position, length, width, and thickness of the line.
|Detector type||Silicon drift detector (SDD)|
|Energy resolution||154 eV (Cu-Kα)
(equivalent to 135 eV with Mn-Kα)
|Detection element||B5 - Am95|
|Qualitative analysis||Auto ID and manual ID|
|Quantitative analysis||Standardless quantitative analysis|