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Hitachi

Tabletop MicroscopeHitachi High-Technologies GLOBAL

Cross section of Chinese yam

Image of Cross section of Chinese yam

Cross section of Chinese yam cut with a thin knife. TM3030Plus/TM3030 can be observed non conductive samples and water contained samples through a low vacuum method without sample preparation.
Not only a cell wall and a starch grain but also calcium oxalate (needle crystal), which causes itchiness, can be observed.
TM3030 / TM3030Plus can be obtained clear images of uncoated samples using a highly sensitive semiconductor detector although low accelerating voltage observation at low vacuum environment may be degraded image quality.

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