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TM4000II/4000PlusII can be used to check the surface of specimen after milling. Furthermore it is possible to transfer the specimen stub of IM4000 directly to the TM4000II/4000PlusII.
The 5 kV accelerating voltage having both shape and composition information of the surface clearly demonstrates the crystal contrast due to composition difference.
TM4000II/4000PlusII can quickly make the observation at low vacuum in a few minutes and the resin-embedded samples can be observed without sample preparation because it is equipped with a high sensitive backscattered electron detector. The data is Au bonding wire which is treated by the ion milling.
BSE images at 5kV enable to identify only the composition contrast but also the contrast of crystals.