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Hitachi High-Tech Science America, Inc.

All Our VORTEX® Silicon Drift X-Ray Detectors Feature

  • No liquid Nitrogen (LN2), thermoelectrically cooled
  • Single active area (between 30 mm2 and 80 mm2)
  • Excellent resolution (<130 eV FWHM is typical)
  • High count rate capability (ICR > 2 Mcps), OCR > 900 kcps at 0.1 µs
  • Virtually zero loss in energy resolution and no peak shift with count rate
  • Cool down times are typically less than 3 minutes
  • RoHS Compliant

Typical Applications

  • X-ray fluorescence (XRF) & TXRF spectroscopy - both bulk and micro-fluorescence
  • X-ray diffraction (XRD)
  • PIXE (Partical Induced X-ray Emission)
  • Microanalysis and fast X-ray mapping
  • Synchrotron applications
  • Process control

All Vortex® X-Ray Spectroscopy Systems include the detector unit and control box which includes power supplies for the detector, TEC and an optional digital pulse processor (DPP) with our PI-SPEC/VTXDLL data acquisition software.

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