SEM-TES application to chemical state analysis on cation of electrode materials for electrochemical capacitors based on the sensitivity correction of X-ray intensity data
M.Ohgaki, S.Matsumura, M.Miyayama, et.al. SEM-TES application to chemical state analysis on cation of electrode materials for electrochemical capacitors based on the sensitivity correction of X-ray intensity data, ISIEM 2013(The International Symposium on Inorganic and Environmental Materials 2013), University of Rennes 1, Rennes, France (2013).
Effects of Microstructure on Electrode Properties of Nanosheet-Derived Hx(Ni1/3Co1/3Mn1/3)O2 for Electrochemical Capacitors
M. Yano, S. Suzuki, M. Miyayama, M. Ohgaki, Effects of Microstructure on Electrode Properties of Nanosheet-Derived Hx(Ni1/3Co1/3Mn1/3)O2 for Electrochemical Capacitors, Nanomaterials Vol.3, NO.2, p.204-220 (2013).
Electric spectroscopy of vortex states and dynamics in magnetic disks
Minori Goto, Hiroshi Hata, Akinobu Yamaguchi1, Yoshinobu Nakatani, Takehiro Yamaoka, Yukio Nozaki, and Hideki Miyajima, Electric spectroscopy of vortex states and dynamics in magnetic disks, Phys. Rev. B 84, 064406 (2011).
MFM Observation of Neodymium Magnets for Electric Automobile with Ultra High Coercivity Probe in Vacuum Environment
T. Yamaoka, H. Tsujikawa, R. Hirose, H. Kawamura and A. Ito, "MFM Observation of Neodymium Magnets for Electric Automobile with Ultra High Coercivity Probe in Vacuum Environment", CY-03, The 2nd International Symposium on Advanced Magnetic Materials and Applications (ISAMMA 2010), 2010.7.12-16, Sendai, Japan (2010).
Current manipulation of a vortex confined in a micron-sized Fe19Ni81 disk
A. Yamaguchi, K. Motoi, H. Miyajima, A. Hirohata, T. Yamaoka, T. Uchiyama, and Y. Utsumi, "Current manipulation of a vortex confined in a micron-sized Fe19Ni81 disk", Appl. Phys. Lett. 95, 122506_1-122506_3 (2009).
Magnetic Force Microscopic Study on Domain-Wall Molecules in NiFe Nano Rings
K. Sasage, N. Okamoto, H. Tsujikawa, T. Yamaoka, and E. Saitoh, ""Magnetic Force Microscopic Study on Domain-Wall Molecules in NiFe Nano Rings"", Solid State Phenomena, 152-153, 529-532 (2009).
Magnetic force microscopy for domain-wall molecules in NiFe nano rings Solid State Phenomena
K. Sasage, N. Okamoto, H. Tsujikawa, T. Yamaoka, E. Saitoh, Magnetic force microscopy for domain-wall molecules in NiFe nano rings Solid State Phenomena, Vol. 152-153, 529 (2009).
Room Temperature Nanoimprinting Using Release-Agent Spray-Coated Hydrogen Silsesquioxane
M. Okada, K. Nakamatsu, M. Iwasa, K. Kanda, Y. Haruyama, S. Matsui, Room Temperature Nanoimprinting Using Release-Agent Spray-Coated Hydrogen Silsesquioxane, Appl. Phys. Exp., 2, 016502 (2009).
Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Domains
R. Hirose and T. Yamaoka: "Scanning Nonlinear Dielectric Microscopy for Investigation of Ferroelectric Domains", International Tutorial Workshop on Piezoresponse Force Microscopy - 5, August 19, 2009. National Institute for Materials Science (NIMS), Tsukuba, Japan (2009).
'Temperature Dependence of Release Effect for antisticking Layer in Nanoimprint by Scanning Probe Microscopy
M. Okada, M. Iwasa, K. Nakamatsu, N. Yamada, K. Kanda, Y. Haruyama, S. Matsui, 'Temperature Dependence of Release Effect for antisticking Layer in Nanoimprint by Scanning Probe Microscopy', Jpn. J. Appl. Phys. 47, 7467 (2008).
Evaluation of Fluorinated Diamond Like Carbon as Antisticking Layer by Scanning Probe Microscopy
M. Okada, M. Iwasa, K. Nakamatsu, N. Yamada, K. Kanda, Y. Haruyama, S. Matsui, ' Evaluation of Fluorinated Diamond Like Carbon as Antisticking Layer by Scanning Probe Microscopy', J. Photopolym. Sci. Technol., 21, 597 (2008).
Identification of Size Differences of Gold Nano-paritcles on Cell Surface by Curvature Reconstruction Method using Atomic Force Microscopy
H. Kim, K. Oikawa, N. Watanabe, M. Shigeno, Y. Shirakawabe, K. Yasuda, Identification of Size Differences of Gold Nano-paritcles on Cell Surface by Curvature Reconstruction Method using Atomic Force Microscopy, Jpn. J. Appl. Phys. Vol.46 No.8, L184 - L186 (2007).
Magnetic characterization of regularly aligned Y-shaped permalloy arrays
K. Sato, K. Machida, T. Yamamoto, T. Ishibashi, T. Yamaoka, Magnetic characterization of regularly aligned Y-shaped permalloy arrays, J. Magn. Magn. Mater. 310, 2342 (2007).
MFM observation of spin structures in nano magnetic dot arrays fabricated by damascene technique
K. Sato, T. Yamamoto, T. Tezuka, T. Ishibashi, Y. Morishita, A. Koukitu, K. Machida, T. Yamaoka, MFM observation of spin structures in nano magnetic dot arrays fabricated by damascene technique, J. Magn. Magn. Mater.304 [1] , 10-13(2006).
Magnetic Domain Wall Manipulation using MFM Probe
T. Yamaoka, E. Saitoh , K. Watanabe, Y. Shirakawabe, H. Miyajima, Magnetic Domain Wall Manipulation using MFM Probe, The 16th International Microscopy Congress(IMC16), Abstracts 782 (2006).
CRITICAL DIMENSION MEASUREMENT USING NEW SCANNING MODE
T.Nishimura, M.Yasutake, K.Watanabe, S.Wakiyama, CRITICAL DIMENSION MEASUREMENT USING NEW SCANNING MODE, ALIGNED CARBON NANOTUBE SPM TIP,The 16th International Microscopy Congress(IMC16), Abstracts(2006).
Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode
Y.Saito, M.Motohashi, N.Hayazawa, M.Iyoki, S.Kawata, Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode, Appi. Phys. Lett. 88, 143109(2006).
NANO-SCALE PHASE TRANSITION WITHIN HYDROPHILIC CYLINDER FORMED BY AMPHIPHILIC DI- BLOCK COPOLYMER
Shintaro Kitajima, Jung SunYoung, Takeshi Yamada, Hirohisa Yoshida, Masanori Iwasa, NANO-SCALE PHASE TRANSITION WITHIN HYDROPHILIC CYLINDER FORMED BY AMPHIPHILIC DI- BLOCK COPOLYMER, Asian coference on Nanoscience & nanotechnology abstract book, 197-198 (2006).
Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode
Y.Saito, M.Motohashi, N.Hayazawa, M.Iyoki, S.Kawata, Nanoscale characterization of strained silicon by tip-enhanced Raman spectroscope in reflection mode, Appi. Phys. Lett. 88, 143109 (2006).
Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube SPM Tip
M. Yasutake, K. Watanabe, S. Wakiyama, T. Yamaoka, Critical Dimension Measurement Using New Scanning Mode and Aligned Carbon Nanotube SPM Tip, Japanese Journal of Applied Physics, Vol. 45, No. 3B, pp.1970-1973. (2006).
Observations of a Single Magnetic Domain Wall in a Nano-Magnet with Magnetic Force Microscopy Japanese Journal of Applied Physics
T. Yamaoka, K. Watanabe, Y. Shirakawabe, K. Chinone, E. Saitoh, H. Miyajima, Observations of a Single Magnetic Domain Wall in a Nano-Magnet with Magnetic Force Microscopy Japanese Journal of Applied Physics, Vol. 45, No. 3B, 2006, pp.2230-2233. (2006).
Domain structures and magnetic ice-order in NiFe nano-network with honeycomb structure Journal of Applied Physics 97
M. Tanaka, E. Saitoh, H. Miyajima, T, Yamaoka, Y. Iye, Domain structures and magnetic ice-order in NiFe nano-network with honeycomb structure Journal of Applied Physics 97, 10J710/1-10J710/3. (2005).
Measurement of epoxy resin thermal curing temperature by the environment controllable SPM
M. Iwasa, K. Ando, S. Hasumura, Y. Shikakura, N. Okubo, K. Nakamura, K. Watanabe, Measurement of epoxy resin thermal curing temperature by the environment controllable SPM, STM'05/ICSPM13, Sapporo(Japan), Abstract, Wed-Pos-61. (2005).
Measurement of Surface Transition Temperature of Polymer Materials using Scanning Probe Microscope
K. Nakamura, T. Yamaoka, K. Ando, Y. Ichimura, N. Okubo, K. Watanabe, Y. Shikakura, A. Nihei, M. Iwasa, T. Nishimura, Measurement of Surface Transition Temperature of Polymer Materials using Scanning Probe Microscope,STM'05/ICSPM13, Sapporo(Japan), Abstract, Tue-Pos-58, (2005).
Functional Nano-Probes and NEW-SPM System for Bio-Imaging
Y. Shirakawabe, A. Nihei, O. Matsuzawa, M. Shigeno, N. Watanabe, T. Ohtani, S. Sugiyama, T. Yoshino, H. Sekiguchi, H. Muramatsu , A. Inoue, Functional Nano-Probes and NEW-SPM System for Bio-Imaging,STM'05/ICSPM13, Sapporo(Japan), Abstract, Wed-Pos-12, (2005).
Applications of high-resolution MFM system with low moment probe in a vacuum
T. Yamaoka, K. Watanabe, Y. Shirakawabe, K. Chinone, E. Saitoh, M. Tanaka, H. Miyajima, Applications of high-resolution MFM system with low moment probe in a vacuum, IEEE Transaction on Magnetics 41, 2565 (2005).
CRITICAL DIMENSION MEASUREMENT USING NEW SCANNING MODE AND ALIGNED CARBON NANOTUBE SPM TIP
T.Nishimura, M.Yasutake, K.Watanabe, S.Wakiyama, CRITICAL DIMENSION MEASUREMENT USING NEW SCANNING MODE AND ALIGNED CARBON NANOTUBE SPM TIP,The 11th International Beijing Conference and Exibition on Instrumental Analysis(BCEIA2005), Abstracts(2005).
Current-induced resonance and mass determination of a single magnetic domain wall
Eiji Saitoh, Hideki Miyajima, Takehiro Yamaoka, Gen Tatara, Current-induced resonance and mass determination of a single magnetic domain wall,Nature 432, 203-206 (2004).
High-Resolution Magnetic Force Microscopy
T. Yamaoka, Applications of High-Sensitivity, High-Resolution Magnetic Force Microscopy, International Disk Forum, S6-26~43, June 8-10, (2004).
Manipulation of vortex circulation in decentered ferromagnetic nanorings
E. Saitoh, M. Kawabata, K.Harii, H. Miyajima, , T. Yamaoka, Manipulation of vortex circulation in decentered ferromagnetic nanorings,Journal of Applied Physics, Vol.95, No.4, 1986 (2004).
Domain-wall trapping in a ferromagnetic nano-wire network
E. Saitoh, M. Tanaka, H. Miyajima, T.Yamaoka, Domain-wall trapping in a ferromagnetic nano-wire network,Journal of Applied Physics,Vol.93, No.10, 7444 (2003).
Observation of recording pits on phase-change film using a scanning probe microscope
T. Nishimura, M. Iyoki, S. Sadayama, Observation of recording pits on phase-change film using a scanning probe microscope, Ultramicroscopy, 91, 119-126 (2002).
Direct observation on a 12-in. silicon wafer using large atomic force microscopy
T. Nishimura, S. Wakiyama, M. Yasutake, Y. Sugano, N. Fujino, Direct observation on a 12-in. silicon wafer using large atomic force microscopy, J. Vac. Sci. Technol. B, Vol.18, No.3 (2000) 1190-1193.
Quantitative measurements of Friction coefficient of Polymer surface by Scanning probe microscopy
T.Yamaoka, T.Miyata, Quantitative measurements of Friction coefficient of Polymer surface by Scanning probe microscopy, Tokyo-2001, SPM, Sensors, Nanostructures, Abstracts, 61 (2001).
Direct observation on a 12-in. silicon wafer using large atomic force microscopy
T. Nishimura, S. Wakiyama, M. Yasutake, Y. Sugano, N. Fujino, Direct observation on a 12-in. silicon wafer using large atomic force microscopy, J. Vac. Sci. Technol. B, Vol.18, No.3, 1190-1193 (2000).