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Hitachi

Hitachi High-Technologies in Korea

Scanning Electron Microscopes (SEM)

Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM) with innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance

SCIENTIFIC INSTRUMENT NEWS

Tabletop Microscope (Benchtop SEM)| TM4000/TM3030Plus/TM3030 Dedicated Website

FE Electron Microscope IEEE Milestone Special Website