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Hitachi

Hitachi High-Technologies in Korea

Atomic Force Microscopes (AFM)

Innovative scanning probe microscopy (SPM) products offering extraordinary levels of performance, value, and ease-of-use for a wide range of application from surface topography to a wide variety of nanoscale surface property measurements

SCIENTIFIC INSTRUMENT NEWS

Tabletop Microscope (Benchtop SEM)| TM4000/TM3030Plus/TM3030 Dedicated Website

FE Electron Microscope IEEE Milestone Special Website