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Hitachi High-Tech in America

The International Symposium for Testing and Failure Analysis (ISTFA) offers the venue to failure analysts for acquiring the knowledge and the resources needed to take on challenges in failure analysis. Visit us at ISTFA 2017 Booth #415 and have a demo of our latest solutions and technologies. HTA will showcase our Field Emission and Variable Pressure Scanning Electron Microscopes (FE- and VP-SEMs), Ion Milling, and AFM.

ISTFA 2017

Dates 11/5/17-11/9/17
Location Pasadena, CA, USA