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Hitachi High-Tech in America

Join us for this webinar, “Segmentation Series Part 1: Fusing the Pieces of FIB-SEM Data.”

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In today’s cutting-edge fields that utilize microscopy, there is a common need for an end-to-end solution that encompasses both image visualization and analysis for users of all experience levels. In order to fill this need, Hitachi High-Tech America and Media Cybernetics have teamed up to bring extensive experience in creating synergistic solutions for imaging-related applications.

In part 1 of our series on segmentation, we will explore Fusing the Pieces of FIB-SEM Data whereby we will discuss image segmentation methodologies as they are applied to electron and ion microscopy generated data. We will feature 3D visualization, segmentation, and more using real-world data from some of Hitachi’s latest imaging platforms in conjunction with Media Cybernetics cutting-edge software packages.

Please join us for this interactive and informational session as we experience a taste of modern applications for a modern world.

Date/Time

1:00 PM EST - 2:00 PM EST, Thursday, November 5, 2020

Presenters

Jamil J. Clarke: Hitachi High-Tech America
Jamil J. Clarke
Hitachi High-Tech America

Jeff Knipe: Media Cybernetics
Jeff Knipe
Media Cybernetics

 

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