Throughout history, materials and materials science have played a critical role in the development of the world around us. Aspects of this field impact each one of us daily in the form of everything from simple household items to handheld digital devices and more. In the development of such items, the electron microscopes have been at the core of many important contributions to the field of materials science, whereby, they provided the ability to elucidate characteristics of morphology, composition, physical properties, and even dynamic behavior of incorporated materials. Such instruments are also indispensable for product quality control and understanding the development of new materials. Hitachi High-Tech offers a diverse product line-up to address these points and more, including tabletop SEM systems for quick user-friendly operation, FE-SEM as well as TEM systems for performing high-resolution analyses, and FIB-SEM systems capable of three-dimensional volumetric analysis.
Tabletop Microscope TM4000 II / TM4000Plus II
The Future of Tabletop Microscopes is Here!
Scanning Electron Microscope FlexSEM 1000 IIThe FlexSEM 1000 II VP-SEM combines innovative technological features with an intuitive interface, to deliver adaptability and flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology and circuitry provides unrivaled imaging performance, even in variable-pressure environments, a feature previously only available in a full-sized SEM. This SEM runs on clean energy for an economical analytical tool, without compromising performance.
Scanning Electron Microscope SU3800/SU3900Performance & Power in a Flexible Platform
Schottky Field-Emission Scanning Electron Microscope SU5000SU7000: The Next-Generation FE-SEM
Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination.
Focused Ion and Electron Beam System Ethos NX5000Unsurpassed Performance with Ultimate Flexibility
Ultra-high Resolution Scanning Electron Microscope SU9000The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality elemental analysis. Unique object lens design has a capability of EELS and diffraction as well.
Field Emission Transmission Electron Microscope HF5000Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance
Ion Milling System ArBlade 5000The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.
Ion Milling System IM4000 PlusThe IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted cross-section milling or flat milling, without applying mechanical stress to the sample.
Sample Cleaner ZONESEMⅡThe ZONESEMⅡ｡ Tabletop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging.
Sample Cleaner ZONETEM ⅡThe innovative ZONETEM II Desktop Sample Cleaner uses UV-based cleaning technology to minimize or eliminate hydrocarbon contamination for electron microscopy imaging. ZONE offers easy-to-use cleaning for pre-analysis sample preparation, ensuring the best possible data from your TEM samples.
MC1000 Ion Sputter CoaterDesigned and built to Hitachi’s extraordinary standards, the Hitachi MC1000 Ion Sputter Coater is poised to perform in your lab for years to come.
Search
U.S.A.
