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Throughout history, materials and materials science have played a critical role in the development of the world around us. Aspects of this field impact each one of us daily in the form of everything from simple household items to handheld digital devices and more. In the development of such items, the electron microscope and scanning probe microscope have been at the core of many important contributions to the field of materials science, whereby, they provided the ability to elucidate characteristics of morphology, composition, physical properties, and even dynamic behavior of incorporated materials. Such instruments are also indispensable for product quality control and understanding the development of new materials. Hitachi High-Tech offers a diverse product line-up to address these points and more, including tabletop SEM systems for quick user-friendly operation, FE-SEM as well as TEM systems for performing high-resolution analyses, FIB-SEM systems capable of three-dimensional volumetric analysis, and AFM systems for non-destructive characterization at the nanoscale.