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Semiconductor scaling continues to this day at a remarkable rate. Now more than ever, cutting-edge technologies and techniques are being utilized to control device architecture at the atomic level. To this end, electron microscopy has proven to be an indispensable constituent of the industry because it allows for not only ultra-high-resolution imaging with a quick turnaround time, but also application on scales ranging from the package level to the atomic level required for the evaluation of controlled gate structures. Hitachi High-Tech provides the most advanced in-line analysis tools for semiconductor development and manufacturing as well as for failure analysis and quality assurance. Our expansive portfolio includes a wide range of microscopy solutions including the world's highest-resolution FE-SEM, unique FIB-SEM systems, TEM, AFM, traditional SEM, and sample preparation equipment.