Our systems enable inspections to find metal particle contaminants embedded in opaque products, such as electrode plates, that cannot be detected using visible light. We offer inspection systems customized according to the inspection width, line speed, and other characteristics. Combining these systems with our X-ray Particle Contaminant Analyzer EA8000A enables more efficient inspection and analysis.
For details on introducing one of our in-line systems and an example of contaminant detection, click the supplementary materials button below.