The 82nd Annual Meeting of the Meteoritical Society (MetSoc2019)

Join Hitachi at the 82nd Annual Meeting of the Meteoritical Society (MetSoc2019) in Sapporo, Japan, and explore the latest technologies and solutions Hitachi offers.

Dates

Jul 7-12, 2019

Venue

• Conference Hall
  Hokkaido University, Sapporo, Japan
  N8 W5, Kita-ku, Sapporo, 060-0808 Japan

Products (Catalog)

• Field Emission Transmission Electron Microscope HF5000
• Focused Ion and Electron Beam System Ethos NX5000
• Focused Ion and Electron Beam System & Triple Beam System NX2000
• Real-time 3D analytical FIB-SEM NX9000
• Ultra-high Resolution Scanning Electron Microscope SU9000
• Ultra-high Resolution Scanning Electron Microscope Regulus Series
• Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000
• Scanning Electron Microscopes SU3800/SU3900
• Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
• Tabletop Microscopes TM4000/TM4000Plus

• For more details and registration info of the 82nd Annual Meeting of the Meteoritical Society (MetSoc2019)

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