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Analytical Systems, Electron Microscopes & Medical Systems

Nano-probing System

Nanoscale Device Characteristics Analysis System Lineup

Nanoscale Device Characteristics Analysis System Nano-Prober NP6800

NP6800 is an SEM-based nano probing system optimized for electrical characterization of 10nm device and beyond. Characteristic evaluation using heating and cooling stage and EBAC analysis are also supported.

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Electron Beam Absorbed Current (EBAC) Characterization System nanoEBAC NE4000

NE4000 is an SEM-based probing system developed for electrical characterization of semiconductor devices, materials and electric components as well as for EBAC analysis.

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