Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM) with innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance
Hitachi High-Technologies‘ scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.
SU3500 employs thermionic electron source and accommodates a sample with maximum diameter of 200mm or maximum height of 80mm. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Improved resolution at low accelerating voltage and optional Ultra Variable pressure Detector (UVD) enhance surface imaging capability of samples.
S-3700N employs thermionic electron source and accommodates a sample with maximum diameter of 300mm or maximum height of 110mm. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging.
FlexSEM 1000 employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional Ultra Variable pressure Detector (UVD) enhance surface imaging capability of samples under low vacuum environment.
Applications of SEM (Scanning Electron Microscopes) are available on S.I.navi, Hitachi Membership Site.
“S.I.navi” is Hitachi Membership Site for analytical instruments users.
“S.I.navi” provides helpful information for daily analysis.
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