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SEM (Scanning Electron Microscopes)

Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM) with innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance

Scanning Electron Microscope SU3500

SU3500 employs thermionic electron source and accommodates a sample with maximum diameter of 200mm or maximum height of 80mm. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Improved resolution at low accelerating voltage and optional Ultra Variable pressure Detector (UVD) enhance surface imaging capability of samples.

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Scanning Electron Microscope S-3700N

S-3700N employs thermionic electron source and accommodates a sample with maximum diameter of 300mm or maximum height of 110mm. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging.

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Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II

FlexSEM 1000 employs thermionic electron source and achieves resolution of 4.0nm with its compact design ready for desktop setup. Low vacuum mode allows rapid observation of insufficiently conductive samples without metal coating to prevent charging. Optional Ultra Variable pressure Detector (UVD) enhance surface imaging capability of samples under low vacuum environment.

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Related topics

Applications of SEM (Scanning Electron Microscopes) are available on S.I.navi, Hitachi Membership Site.

S.I.navi

“S.I.navi” is Hitachi Membership Site for analytical instruments users.
“S.I.navi” provides helpful information for daily analysis.

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