SEM (Scanning Electron Microscopes)
Standard and Variable-Pressure Scanning Electron Microscopes (SEM & VP-SEM) with innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance
Scanning Electron Microscopes SU3800/SU3900
Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.
Scanning Electron Microscope FlexSEM 1000 II
The FlexSEM 1000 II VP-SEM combines innovative features with an intuitive interface, to deliver flexibility in a powerful, automated, lab-friendly package. Cutting-edge technology provides unrivaled imaging performance, even in variable-pressure environments, a feature typically available in full-sized SEMs.
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Applications of SEM (Scanning Electron Microscopes) are available on S.I.navi, Hitachi Membership Site.
“S.I.navi” is Hitachi Membership Site for analytical instruments users.
“S.I.navi” provides helpful information for daily analysis.
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