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Hitachi

Scientific Instrument NEWSHitachi High-Technologies GLOBAL

The NX9000 is a processing and observation system for three-dimensional analysis, with an FIB and SEM arranged perpendicular to each other. Optimal positioning of the FIB-SEM columns and detection systems allows high-resolution, three-dimensional, multi-analysis

Main Features

  1. New FIB and new SEM column allow high-speed, highly precise processing and high-resolution observation.
  2. A Multi-Cut & See function allows continuous, automatic acquisition of observed images at multiple locations within a processed slice, which accomplish with both wide field-of-view analysis and high-resolution analysis.
  3. Multi-axis/environmental holders for Hitachi TEM can be installed to allow linkage between equipments or use of various specimens.

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