Skip to main content
Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.
The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever’s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!
Conventional tuning system
Delicate fibers are deformed and damaged in cross directions.
The complex fiber structure is clearly observed with no damage.
[Example 1] Fibrous carbon nano-tube structure
(Gecko adhesive tape, sample generously provided by Nitto Denko Corporation)
Conventional recommendation value
Crystal steps are destroyed and unclear.
A stable observation of crystal steps by the improved tuning function.
[Example 2] Polycrystalline organic thin-film transistor
(polycrystalline pentacene thin film, sample generously provided by Kitamura Laboratory, Kobe University)
The 3D Overlay Function enables the observation of “cause and effect relationship” between topography and physical properties. A variety of other functions, such as roughness and cross-section analysis, are also standard tools.
Small form factor for flexible, efficient space usage.
|Compatible Units||AFM5100N, AFM5300E|
|RealTuneII||Automatic tuning of amplitude, contact force, scan speed, and feedback gains
(Various tuning modes including Auto, Fast, Soft, Rough, Flat, and Point)
|Various Functions||Operating instructions; Tab structure (Measurement/ Analysis); Movable scopes/ Measurement area tracking; Batch processing; and Tip calibration|
|Multi Channel(Data Points)||4 channels (max. 2,048×2,048)
2 channels (max. 4,096×4,096)
|Rectangular Scan||1:1, 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1|
|Analysis Software||3D display and overlay, Roughness, Cross-section, Average cross-section|
|Power Supply||AC 100V～240V±10%|
* Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments. Those authors are notable researchers and Hitachi application engineers. This is an article of Probe Station AFM5000II / Real TuneII
This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments.