4/13/2017, 2:00 PM-2:45 PM ET
Dr. Jing-Jiang, Senior Product Specialist, AFM
Development of advanced imaging strategies that could break the current limits on detection sensitivity and spatial resolution is highly desired for atomic force microscopy (AFM) technology. In this webinar, we will introduce a new solution for AFM— Sampling Intelligent Scan (SIS). Unlike some widely used AFM methods, including the contact mode and tapping mode, SIS features a new technique where the AFM tip approaches, engages with the sample, and collects data at each pixel, followed by the inter-pixel movement when the tip is withdrawn from the sample. As a result, SIS renders complete elimination of the lateral force, better tracking of the sample, and well-defined tip-sample interactions. Examples of SIS-enabled high-resolution and high-sensitivity imaging of challenging materials will be presented.
Dr. Jing-Jiang Yu is the senior product specialist for the AFM products at the Nanotechnology Systems Division of Hitachi High Technologies America, Inc. (HTA). He received his Ph.D. in Chemistry from the University of California, Davis in 2006. His doctoral thesis focused on using scanning probe lithography to study the size-dependent surface chemistry and biochemistry. From 2006 to 2014, he served as the senior AFM applications scientist for nanotechnology measurements. His AFM expertise includes applications of SPM/AFM techniques on graphene or its derivatives, structural characterization of organic thin films, and investigation of surface-initiated reactions under various well-controlled environments. He is the co-author of 50+ publications and 3 book chapters.
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